发明名称 Heterojunction FET with a high potential barrier layer and gate structure
摘要 A field effect semiconductor device which restricts current flow through a drain-gate path, but allows current to easily flow through a gate-source path. A high potential barrier layer is formed on the drain side of an active layer. The potential barrier layer has a wider energy band gap than the active layer. A source electrode and a drain electrode make ohmic contact with the active layer and a gate electrode exists between the source electrode and the drain electrode. The gate electrode is partially formed on the potential barrier layer and makes Schottky contact with the active layer on the source side of the semiconductor device and makes Schottky contact with the potential barrier layer on the drain side of the semiconductor device.
申请公布号 US5399886(A) 申请公布日期 1995.03.21
申请号 US19940186466 申请日期 1994.01.26
申请人 FUJITSU LIMITED 发明人 HASEGAWA, YUUICHI
分类号 H01L21/285;H01L21/338;H01L29/06;H01L29/40;H01L29/423;H01L29/78;H01L29/80;H01L29/812;(IPC1-7):H01L29/784;H01L29/804 主分类号 H01L21/285
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