发明名称 Method of manufacturing CuInSe2 thin film solar cell
摘要 The quality of CuInSe2 solar cells is estimated during the manufacturing process by using a photoluminescence analysis. Emitted luminescence is measured upon irradiation of a CuInSe2 thin film with laser light, and estimation is performed on the basis of the luminous intensity. Specifically, non-defective products can be obtained by using lots in which the maximum luminous intensity in the spectral range of luminescent light of 0.8 DIFFERENCE 0.9 eV of a sample cooled to liquid nitrogen-temperature or to liquid helium temperature is not lower than a predetermined value or is higher than the maximum luminous intensity in the spectral range of 0.9 DIFFERENCE 1.0 eV. Further, after the manufacturing process is completed, by using this estimation, it is possible to rank the products after completion of the manufacturing process.
申请公布号 US5399504(A) 申请公布日期 1995.03.21
申请号 US19940222362 申请日期 1994.04.04
申请人 FUJI ELECTRIC CORPORATE RESEARCH & DEVELOPMENT LTD. 发明人 OHSAWA, MICHIO
分类号 A47L9/32;H01L31/032;H01L31/0336;(IPC1-7):H01L31/18;H01L31/072 主分类号 A47L9/32
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