发明名称 INFRARED LIGHT ABSORPTIVITY MEASURING INSTRUMENT
摘要 PURPOSE:To decrease unnecessary process such as the constitution of a display defective liquid crystal cell by precisely evaluating the intra surface uniformity of a function such as an orienting function for an orienting film in a short time. CONSTITUTION:This measuring instrument is equipped with a light source 101 which emits diode laser light, a polarizing element 104 which is installed on the optical path of the diode laser light emitted by the light source 101 and separates the diode laser light into polarized light with two kind of different polarization planes, condenser 103 which converges the diode laser light into laser beam, an X-Y stage 105 which is mounted with a measured body to be irradiated with the laser beam and shifted in relative position to the laser beam by a position shifting means, and a detector 107 which detects the intensity of light transmitted through the measured body irradiated with the laser beam by at least every two kinds of polarized light; and the diode laser light is used as source light to precisely evaluate the intra surface uniformity of the function of the measured body in a short time.
申请公布号 JPH0777692(A) 申请公布日期 1995.03.20
申请号 JP19930226112 申请日期 1993.09.10
申请人 TOSHIBA CORP 发明人 ISHIBASHI TAEKO;HASEGAWA TSUTOMU;MORI YASUSHI
分类号 G01M11/00;G02F1/1337;G09F9/00;(IPC1-7):G02F1/133 主分类号 G01M11/00
代理机构 代理人
主权项
地址