发明名称 WAFER HOLDING DEVICE FOR RESIST DEVELOPMENT
摘要 <p>PURPOSE:To prevent a resist, which is removed by a development, from adhering and remaining on the rear of a wafer in the wafer which goes through a resist development process. CONSTITUTION:A gas blowing groove 21 is formed in such a way as to surround a groove 26 for evacuation formed in a head main body 20. The outer peripheral part 24 of the groove 21 is formed lower than the inner peripheral part 25 of the groove 21. When a wafer is vacuum-sucked the main body 20 and a developing, a rinsing and the like are performed, a resist, which is inclined to creep on the rear of the wafer, is blown away by blowing gas made to jet through the groove 21 and the clean rear is maintained. Accordingly, as the resist, which functions as an insulator, is not adhered on the rear of the wafer, a semiconductor device is manufactured at a high yield.</p>
申请公布号 JPH0778745(A) 申请公布日期 1995.03.20
申请号 JP19930221917 申请日期 1993.09.07
申请人 NISSHIN STEEL CO LTD 发明人 KAJIMOTO ATSUSHI
分类号 H01L21/027;H01L21/304;H01L21/68;H01L21/683;(IPC1-7):H01L21/027 主分类号 H01L21/027
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