METHOD FOR INSPECTING DEFECT,申请号JP19930242212-传众专利搜索

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发明名称	METHOD FOR INSPECTING DEFECT
摘要
申请公布号	JPH0772096(A)	申请公布日期	1995.03.17
申请号	JP19930242212	申请日期	1993.09.03
申请人	DAINIPPON PRINTING CO LTD	发明人	SHIMIZU SATOSHI
分类号	G01N21/88;G01M11/00;G02F1/13;(IPC1-7):G01N21/88	主分类号	G01N21/88
代理机构		代理人
主权项
地址

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