发明名称 TEST METHOD OF MEMORY OF COMPUTER SYSTEM
摘要 PURPOSE: To determine in which of data, error correction code(ECC) or address a memory error a memory error is generated by retesting that position while using an address sensitive memory test pattern when the memory error is generated. CONSTITUTION: A computer system 10 is provided with a central processor 12 and a main memory 14. Address-sensitive test data are used for testing the computer system 10. When the memory error is generated or the initial test of the memory 14 shows an error, the address sensitive memory test pattern selecting that position is retested. By selecting the proper address sensitive memory test pattern, all the data bit, ECC bit and address parity bit can be tested. Thus, it can be determined which of the data, ECC or address the memory error is generated at.
申请公布号 JPH0773115(A) 申请公布日期 1995.03.17
申请号 JP19910014724 申请日期 1991.01.14
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 CHINSHIYAN CHIEN;POORU JIYURIASU ROI
分类号 G06F12/16;G06F11/10;G11C29/02;G11C29/10 主分类号 G06F12/16
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