发明名称 SEMICONDUCTOR LASER
摘要 PURPOSE:To monitor a light emission amount of a laser chip accurately even if a diffusion angle of laser beam emitted to the rear of a laser chip changes by reflecting rear light emitted to a reverse direction of laser beam from a light emission means to a specified inside space and by detecting intensity of light in the inside space thereafter. CONSTITUTION:A photodetector 4 which is a detection means is attached to an inside of an inside integrating sphere 3 which is an inside reflection means, detects light for a part of a laser chip 2 which is a light emission means converted random diffused light and detects its light amount. Therefore, even if a diffusion angle of laser light L2 emitted from a rear 2b of the laser chip 2 is changed, there is no possibility of ratio between a whole light amount thereof and a light amount of laser beam detected by the photo detector 4 changing. As a result, a light emission amount of the laser chip 2 can be accurately monitored. Therefore, reliability of control by an automatic light amount adjustment circuit can be greatly improved.
申请公布号 JPH0774428(A) 申请公布日期 1995.03.17
申请号 JP19930168450 申请日期 1993.06.15
申请人 CANON INC 发明人 MOGI SHIN
分类号 B41J2/44;G02B26/10;G02F1/1335;H01S3/02;H01S5/00 主分类号 B41J2/44
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