发明名称 Device for examining weather resistance and light-fastness
摘要 The present invention provides a device, using which sample bodies can be examined by exposing them to highly energetic radiation energy, so that a uniform radiation density is achieved over the entire surface area of the sample body. In this case, the internal space of a test chamber (1) is divided by a glass filter (2) into a lower section which forms a sample chamber (3) and an upper section which forms a lamp chamber (4). The sample chamber (3) has a sample base-plate (6) which is arranged at a predetermined distance from the glass filter (2) and on which sample bodies (19) are arranged. The lamp chamber (4) has a lamp (8) which is bent to an angle and permits a uniform radiation density over the entire surface area of the sample base-plate (6), the lamp (8) being arranged at a predetermined distance from the glass filter (2). A fan (11) for supplying cooling air to cool the internal space of the lamp chamber (4) and the lamp (8) is furthermore provided. <IMAGE>
申请公布号 DE4330759(A1) 申请公布日期 1995.03.16
申请号 DE19934330759 申请日期 1993.09.10
申请人 SUGA TEST INSTRUMENTS CO., LTD., TOKIO/TOKYO, JP 发明人
分类号 G01N17/00;(IPC1-7):G01N17/00;G21K5/04 主分类号 G01N17/00
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