发明名称 Static random access memory for gate array devices.
摘要 A gate array device (10) includes a plurality of static random access memory cells (11). Each memory cell (11) comprises n-channel pass gate transistors (12, 14), n-channel drive transistors (16, 18), and p-channel transistors (20, 22). All transistors within the memory cell (11) are approximately of the same size. A resistance element (23) connects to the p-channel transistors (20, 22) in each memory cell (11), generating a new apply voltage ( Vcr). The resistance element (23) effectively reduces the size of the p-channel transistors (20, 22) to below the size of the drive transistors (16, 18). By effectively reducing the size of the p-channel transistors (20, 22), the speed, accuracy, and stability of the memory cell (11) are enhanced despite the similar sizes of the transistors in the gate array device (10). <IMAGE>
申请公布号 EP0590591(A3) 申请公布日期 1995.03.15
申请号 EP19930115622 申请日期 1993.09.28
申请人 TEXAS INSTRUMENTS INC 发明人 HASHIMOTO MASASHI
分类号 G11C11/413;G11C11/412;H03K3/012;H03K19/177 主分类号 G11C11/413
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