发明名称 Integrated circuit transistor having drain junction offset.
摘要 <p>Method comprises: forming gate insulation over a conductive layer; adding gate electrode; forming gate sidewall spaces; masking drain and implanting fast-diffusing dopant (I) into the source region; removing the mask and implanting slow-diffusing dopant (II) into the drain region; and annealing to diffuse the dopants so that a drain junction offset results.</p>
申请公布号 EP0643419(A2) 申请公布日期 1995.03.15
申请号 EP19940306318 申请日期 1994.08.26
申请人 STMICROELECTRONICS, INC. 发明人 BRYANT, FRANK RANDOLPH;HODGES, ROBERT LOUIS
分类号 H01L21/336;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/336
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