发明名称 APPARATUS AND METHOD FOR WIRING LAYER OF SEMICONDUCTOR IC
摘要 The method includes spraying melted metal material (11) in a tundish (12) under high temp. of inert gases circumstances, with a spray unit (13) and colliding the melted metal, i.e., Al or Cu of liquid droplet state against a silicon substrate (14) at a high speed to solidify the Al or Cu metal droplets on the substrate (14) rapidly, thereby forming a flat wiring layer on the substrate to improve step coverage and uniformity.
申请公布号 KR950002176(B1) 申请公布日期 1995.03.14
申请号 KR19920008291 申请日期 1992.05.16
申请人 GOLDSTAR ELECTRON CO., LTD. 发明人 CHON, YONG - KWON
分类号 H01L21/203;(IPC1-7):H01L21/203 主分类号 H01L21/203
代理机构 代理人
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