发明名称 Phase mask for projection lithography and method for the manufacture thereof
摘要 A carrier of light-transmissive material has a mask pattern of light-absorbent material arranged thereon. The carrier comprises first regions and second regions that are not covered by the absorbent material. An optical thickness of the carrier in the first regions differs from an optical thickness in the second regions such that a phase difference of 180 DEG +/-60 DEG exists between light that has traversed the first regions and light that has traversed the second regions. For manufacturing the phase mask, the first regions are produced by isotropic etching of the light-absorbent material and the second regions are produced by anisotropic etching into the carrier.
申请公布号 US5397664(A) 申请公布日期 1995.03.14
申请号 US19930125805 申请日期 1993.09.24
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 NOELSCHER, CHRISTOPH;MADER, LEONHARD
分类号 G03F1/00;H01L21/027;(IPC1-7):G03F9/00 主分类号 G03F1/00
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