MESSVORRICHTUNG ZUR SCHICHTDICKENMESSUNG MIT RADIONUKLIDEN,申请号DE19702039646-传众专利搜索

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发明名称	MESSVORRICHTUNG ZUR SCHICHTDICKENMESSUNG MIT RADIONUKLIDEN
摘要
申请公布号	DE2039646(B2)	申请公布日期	1972.12.07
申请号	DE19702039646	申请日期	1970.08.10
申请人		发明人
分类号	G01B15/02;(IPC1-7):G01B15/02	主分类号	G01B15/02
代理机构		代理人
主权项
地址

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