| 摘要 |
An elongated probe including at least one segment of X-ray-opaque material of known length along the dimension parallel to the axis of the probe is used to provide a standard scale for dimensional determination of objects not accessible to direct measurement. The probe is brought into proximity to the object to be measured, X-rays illuminate the object and probe to produce an image, and the image size of the X-ray-opaque material, or of known intervals between adjacent X-ray-opaque segments, is compared with the image size of the object to be measured.
|
