发明名称 FABRICATION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form a multilayer wiring while planarizing the interlayer insulation film and updating a predetermined alignment mark. CONSTITUTION:The method for fabricating a semiconductor device comprises a step for making a contact hole 13 through an insulation film 12 formed on a substrate 11 above a lower wiring layer, a step for forming a metallic material 14 on the substrate 11 where the contact hole 13 is made, a step for removing the metallic material 14 except the contact hole, a step for making an alignment opening on the substrate 11, and a step for forming an upper wiring layer on the substrate where the alignment opening is made.
申请公布号 JPH0766200(A) 申请公布日期 1995.03.10
申请号 JP19930209657 申请日期 1993.08.24
申请人 FUJITSU LTD 发明人 KISHII SADAHIRO;HOKO HIROSANE
分类号 H01L21/027;H01L21/3205;H01L23/52;(IPC1-7):H01L21/320 主分类号 H01L21/027
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