发明名称 |
SELF-TESTING METHOD OF INVERTER DRIVING CIRCUIT |
摘要 |
The method for diagnosing the functions of the inverter by itself before operation includes steps : a) detecting the simultaneous turn-on states of the power transistors by applying the driving pulses in sequence with maximum width; b) stopping the operation when detecting the simultaneous turn-on of the transistor; c) if not, applying over-current to the induction motor and detecting the over-current with the instantaneous current detector; d) running the inverter normally if detecting it, but stopping the operation as alarming otherwise.
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申请公布号 |
KR950002039(B1) |
申请公布日期 |
1995.03.08 |
申请号 |
KR19920003781 |
申请日期 |
1992.03.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HYO - SOK |
分类号 |
G01R31/34;G01R31/00;H02M7/00;H02P27/06;(IPC1-7):H02M7/00 |
主分类号 |
G01R31/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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