发明名称 SELF-TESTING METHOD OF INVERTER DRIVING CIRCUIT
摘要 The method for diagnosing the functions of the inverter by itself before operation includes steps : a) detecting the simultaneous turn-on states of the power transistors by applying the driving pulses in sequence with maximum width; b) stopping the operation when detecting the simultaneous turn-on of the transistor; c) if not, applying over-current to the induction motor and detecting the over-current with the instantaneous current detector; d) running the inverter normally if detecting it, but stopping the operation as alarming otherwise.
申请公布号 KR950002039(B1) 申请公布日期 1995.03.08
申请号 KR19920003781 申请日期 1992.03.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HYO - SOK
分类号 G01R31/34;G01R31/00;H02M7/00;H02P27/06;(IPC1-7):H02M7/00 主分类号 G01R31/34
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