UNIVERSAL BURN-IN BOARD FOR TEST OF SEMICONDUCTOR DEVICE,申请号JP19930199849-传众专利搜索

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发明名称	UNIVERSAL BURN-IN BOARD FOR TEST OF SEMICONDUCTOR DEVICE
摘要
申请公布号	JPH0758172(A)	申请公布日期	1995.03.03
申请号	JP19930199849	申请日期	1993.08.12
申请人	NEC CORP	发明人	KATO NORIAKI
分类号	G01R31/26;G01R31/28;H01L21/66;(IPC1-7):H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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