发明名称 PROBE SYSTEM FOR RADIATION POSITION DETECTOR
摘要 PURPOSE:To provide a probe which can be used at a desired place by projecting specific pattern lights, that are emitted from light projection means of a pair of probes, to the specified one side end of the other one each other for positioning them. CONSTITUTION:Probes (length: about 20cm; diameter: about 5cm) 6 and 6' are placed in a manner that projection faces of flange parts 13 and 13' thereof will face each other. A linear pattern light emitting from projection parts 14 and 15 of the probe 6 is projected onto the flange part 13' to form a cross pattern on the projection surface. Similar operation is done for the probe 6', and the facing position of the probes 6 and 6' is adjusted so that the center of the projection surface and the crossing center of the plus pattern of the parts 13 and 13' may coincide with each other. Thus the scintillators of the probes 6 and 6' can be arranged in a right facing state. In such a state, a measuring region of a person to be examined is inserted in the center of the probes 6 and 6', and radiation generating when positron emission nuclide disappears is measured simultaneously by the probes 6 and 6', so that the generation position of the radiation can be measured.
申请公布号 JPH0755943(A) 申请公布日期 1995.03.03
申请号 JP19930204112 申请日期 1993.08.18
申请人 HAMAMATSU PHOTONICS KK 发明人 SATOU NAKAHIRO;UCHIDA HIROSHI
分类号 G01T1/161;(IPC1-7):G01T1/161 主分类号 G01T1/161
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