发明名称 Method and device for etching thin films, preferably indium tin oxide films
摘要 In the case of a device for etching thin films, preferably indium tin oxide films on glass substrates in a vacuum chamber (2), with a plasma source (12) arranged above the latter, a substrate holder (5) opposite this source and a radio-frequency source (8) connected to the substrate holder (5), Cl2 or Cl2 and H2 or CH4 can be introduced as etching gas into the vacuum chamber (2), the radio-frequency bias supply (8, 9) of the substrate holder (5) being adjustable independently of the etching particle density and the plasma source (12) being supplied by a separate radio-frequency source (16) which has its own matching network (17). <IMAGE>
申请公布号 DE4337309(A1) 申请公布日期 1995.03.02
申请号 DE19934337309 申请日期 1993.11.02
申请人 LEYBOLD AG, 63450 HANAU, DE 发明人 KRETSCHMER, KARL-HEINZ, DR.-ING. DR., 63110 RODGAU, DE;GEGENWART, RAINER, DIPL.-PHYS. DR., 63322 ROEDERMARK, DE;LORENZ, GERHARD, 63755 ALZENAU, DE
分类号 H01J37/32;H01L31/18;(IPC1-7):H01J37/32;H05H1/46;C23F4/00 主分类号 H01J37/32
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