发明名称 RESIN SEALING METHOD FOR SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To provide a method of sealing a semiconductor device with resin high in productivity at a low molding temperature at which eutectic solder used for the inner connection of a circuit assembly is not melted again. CONSTITUTION:A semiconductor device is sealed with resin through such a method that a circuit assembly which includes a semiconductor chip 3 formed on a lead frame 2 is mounted on a heat dissipating metal insulating board 1 and jointed together with eutectic solder 7, and the periphery of the circuit assembly is sealed with resin making the underside of the metal insulating board 1 exposed for the formation of a resin-sealed semiconductor device, wherein mold releasing agent is previously applied onto the underside of the metal insulating board 1. The circuit assembly mounted on the metal insulating board is inserted into an injection molding die 8, and liquid epoxy resin is filled into the cavity of the die 8 at molding temperatures of 140 deg.C to 180 deg.C to form a sealing resin layer.</p>
申请公布号 JPH0745765(A) 申请公布日期 1995.02.14
申请号 JP19930184270 申请日期 1993.07.27
申请人 FUJI ELECTRIC CO LTD 发明人 MARUYAMA ATSUSHI
分类号 B29C45/02;B29L31/34;H01L21/56;H01L23/48;(IPC1-7):H01L23/48 主分类号 B29C45/02
代理机构 代理人
主权项
地址