发明名称 PATTERN FORMING METHOD
摘要 PURPOSE:To prevent the sag of a resist pattern side wall and the decrease of dimension controllability, by a method wherein a resist pattern is formed, the whole surface is coated with resin which does not mingle with resist, heat flow of the resist is generated by heat treatment, and then the resin spread on the resist is eliminated. CONSTITUTION:Resist 2 is spread on a substrate 1 to be worked. Resist whose main component is positive type novolak system resin is used. The resist in a desired part is selectively eliminated by using ordinary lithography. Water-soluble resin 4 is spread on the whole surface, and then heat-treated at a temperature higher than or equal to the softening temperature of the resist. The water- soluble resin 4 is eliminated by rinsing.
申请公布号 JPH0745510(A) 申请公布日期 1995.02.14
申请号 JP19930192151 申请日期 1993.08.03
申请人 HITACHI LTD 发明人 HASEGAWA NORIO;HAYANO KATSUYA
分类号 G03F7/40;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/40
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