发明名称 APPARATUS AND METHOD FOR DETECTING ALIGNMENT OF CONTACTS IN A MULTI-SUBSTRATE ELECTRONIC ASSEMBLY
摘要 <p>An apparatus and method for detecting alignment of corresponding contacts (205 and 206) in a multi-substrate electronic assembly (107). In a preferred embodiment, a liquid crystal display (LCD) assembly (107) includes a display substrate (201) having first (205) and third (701) contacts and a printed circuit substrate (204) having second (206) and fourth (702) contacts. The first (205) and second (206) contacts are subject to alignment according to a first criterion. The third (701) and fourth (702) contacts are subject to alignment according to a second criterion more restrictive than the first criterion. A path (709) permits electrical coupling between the third (701) and fourth (702) contacts. A measure of the electrical coupling through the path (709) is indicative of alignment of the third (701) and fourth (702) contacts according to the second criterion, such that alignment of the third (701) and fourth (702) contacts according to the second criterion is indicative of alignment of the first (205) and second (206) contacts according to the first criterion.</p>
申请公布号 WO1995004286(A1) 申请公布日期 1995.02.09
申请号 US1994007039 申请日期 1994.06.20
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