Photoelectric device having a test object

摘要

A photoelectric device (1) for locating obstructions which enter a scanning surface having an edge shape of any desired design, having a transmitter (2), a spatially resolving detector (3) and a deflection device (7) which carries out a cyclic movement, so that a transmitted light beam (5) which is transmitted by the transmitter (2), and a received light beam (6) which is reflected by an obstruction and strikes the detector (3), both being passed via the deflection device (7), paint over the scanning surface, the deflection device (7) having a measured value sensor for determining the angular position of the transmitted light beam (5), and the signals of the spatially resolving detector (3) and of the measured value transmitter being supplied to an evaluation unit, and it being possible to check the functionality (serviceability) of the transmitter (2) and of the detector (3) by means of a test measurement by the transmitted light beam (5) being fed via a test object (4) to the detector (3). The test object is arranged other than on the scanning surface and is installed in the photoelectric device in a fixed position with respect to the transmitter (2) and the detector (3), a transmitted light beam (5) which is reflected on the deflection device (7) being passed via the test object (4) to the detector (3). The device (1) according to the invention is distinguished by the fact that the test object (4) has means using which a specific proportion of the transmitted light beam (5) is passed from the test object (4) to the detector (3). <IMAGE>