发明名称
摘要 <p>PURPOSE:To accurately detect the presence of short-circuit of a junction as digital information by detecting the presence of the short-circuit of junction from an output voltage of a semiconductor element. CONSTITUTION:Since a constant current IC is supplied to Zener diodes ZD0, ZD1, ZD2 normally from MOS transistors (TRs) CC0, CC1 and CC2, a Zener voltage VH is generated from the output of the Zener diodes ZD0, ZD1 and ZD2 and an output level of inverters I0, I1, I2 goes all to '0'. In applying current/voltage pulse between a trim pad PAD1 and a COM, the Zener diode ZD1 causes breakdown and the injection of the Zener diode ZD1 is short- circuited. Thus, the Zener diode ZD1 acts like an element equivalent to a resistive element with a low resistance and an output voltage of the Zener diode ZD1 is a low voltage VL. Thus, the output voltage of each semiconductor element is accurately detected depending on the presence of the short-circuit of the junction by giving a prescribed current to the semiconductor element group having the Zener characteristic.</p>
申请公布号 JPH0711920(B2) 申请公布日期 1995.02.08
申请号 JP19860264632 申请日期 1986.11.06
申请人 HITACHI LTD 发明人 SASE TAKASHI;KATO KAZUO;IKEDA TAKAHIDE
分类号 G11C17/14;G11C17/06;(IPC1-7):G11C17/14 主分类号 G11C17/14
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