发明名称 CONNECTOR FOR INSPECTION AND ITS MANUFACTURE
摘要 <p>PURPOSE:To provide a connector for inspection capable of pressuring at a low pressure so as to permit the evaluation of electrical characteristics in the chip state of flip chip. CONSTITUTION:An inspection connector 1 has a hole in an insulating resin sheet 2 having an excellent heat resistance at a high temperature, a pattern portion 3 made of a metal material is so formed as to cover the peripheral edge portion of at least one opening of said hole, and the whole of the pattern portion is covered and the hole is filled up with a solder 4.</p>
申请公布号 JPH0737942(A) 申请公布日期 1995.02.07
申请号 JP19930181337 申请日期 1993.07.22
申请人 NEC CORP 发明人 YAMASHITA TSUTOMU
分类号 H01L21/66;G01R1/073;H01L21/60;H01L23/498;H05K3/34;(IPC1-7):H01L21/66 主分类号 H01L21/66
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