发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent vertical cracks in a polysilicon Zener diode that are caused by a stress due to the difference in thermal expansion coefficient when a pellet is cooled off after bonding. CONSTITUTION:Polysilicon at the central portion of a cathode region or anode region, of the central portion of a polysilicon zener diode 5 is eliminated. By doing this, vertical cracks of polysilicon zener diode caused by stresses due to the difference in thermal expansion coefficient during the cooling-off of pellet after bonding can be prevented.
申请公布号 JPH0737928(A) 申请公布日期 1995.02.07
申请号 JP19930158275 申请日期 1993.06.29
申请人 NEC YAMAGATA LTD 发明人 SATO HIDEAKI
分类号 H01L21/60;H01L29/861 主分类号 H01L21/60
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