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发明名称
INSPECTION OF WAFER
摘要
申请公布号
JPH0737959(A)
申请公布日期
1995.02.07
申请号
JP19930181335
申请日期
1993.07.22
申请人
NEC CORP
发明人
ONO KAZUHIKO
分类号
G01R31/26;H01L21/66;(IPC1-7):H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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