发明名称 |
Exposure apparatus for photolithography. |
摘要 |
<p>The invention relates to an illuminating system in an exposure apparatus used in the fabrication of semiconductor devices to transfer patterns on a reticle to a substrate or wafer. The illuminating system includes a diaphragm (20) in which an aperture is formed to suitably shape a beam of illuminating light. According to the invention a liquid crystal display panel (22) is used as the principal part of the diaphragm, and the display panel is driven by a control unit (32) so as to display a black-and-white pattern having a white region (26) that is transparent to illuminating light and serves as a beam shaping aperture. According to the particulars of the reticle patterns a selection can be made from several different aperture patterns registered in the control unit. Therefore, when the reticle is changed the diaphragm does not need to be replaced by another. <IMAGE></p> |
申请公布号 |
EP0637780(A1) |
申请公布日期 |
1995.02.08 |
申请号 |
EP19940112057 |
申请日期 |
1994.08.02 |
申请人 |
NEC CORPORATION |
发明人 |
ISHII, HIROYUKI, C/O NEC YAMAGATA LTD. |
分类号 |
H01L21/027;G03F7/20;(IPC1-7):G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|