发明名称 Exposure apparatus for photolithography.
摘要 <p>The invention relates to an illuminating system in an exposure apparatus used in the fabrication of semiconductor devices to transfer patterns on a reticle to a substrate or wafer. The illuminating system includes a diaphragm (20) in which an aperture is formed to suitably shape a beam of illuminating light. According to the invention a liquid crystal display panel (22) is used as the principal part of the diaphragm, and the display panel is driven by a control unit (32) so as to display a black-and-white pattern having a white region (26) that is transparent to illuminating light and serves as a beam shaping aperture. According to the particulars of the reticle patterns a selection can be made from several different aperture patterns registered in the control unit. Therefore, when the reticle is changed the diaphragm does not need to be replaced by another. &lt;IMAGE&gt;</p>
申请公布号 EP0637780(A1) 申请公布日期 1995.02.08
申请号 EP19940112057 申请日期 1994.08.02
申请人 NEC CORPORATION 发明人 ISHII, HIROYUKI, C/O NEC YAMAGATA LTD.
分类号 H01L21/027;G03F7/20;(IPC1-7):G03F7/20 主分类号 H01L21/027
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