发明名称 Device for optically measuring the height of a surface.
摘要 The height of a surface (25) along an axis (4) is determined by measuring the axial position of an irradiated spot (31) formed on the surface at the intersection of the surface and the axis. Radiation reflected by the surface and collected by a lens (8) forms an image spot (32) on the axis (4). The position of the image spot is determined by measuring the intensity of the radiation at at least three positions along the axis by means of a detection unit (35). The output signals (44, 44') of the detection unit are processed in an electronic means (43) for determining the position of the highest radiation intensity and for supplying a signal (43') whose magnitude represents the axial position of the image spot (32), hence, of the irradiated spot (31). <IMAGE>
申请公布号 EP0623804(A3) 申请公布日期 1995.02.01
申请号 EP19940201162 申请日期 1994.04.28
申请人 PHILIPS ELECTRONICS NV 发明人 HORIJON JOSEPH LOUIS;VELZEL CHRISTIAAN HENDRIK FRAN;KOOIJMAN CORNELIS SANDER
分类号 G01B11/02 主分类号 G01B11/02
代理机构 代理人
主权项
地址