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发明名称
INSPECTING DEVICE FOR DEFECT IN SEMICONDUCTOR
摘要
申请公布号
JPH0727828(A)
申请公布日期
1995.01.31
申请号
JP19930192996
申请日期
1993.07.09
申请人
TOUHEI SHOKAI:KK
发明人
TAKAHASHI MASAYOSHI
分类号
G01R31/26;G01R31/28;H01L21/66;(IPC1-7):G01R31/28
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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