发明名称 SEMICONDUCTOR MEMORY AND READING METHOD THEREFOR
摘要 PURPOSE:To provide a reading circuit capable of expanding the reading room of a memory and reducing patterns and a peak current and a semiconductor storage device capable of operating a reading system using this circuit. CONSTITUTION:A voltage variable circuit 9 for supplying a plurality of different sized potentials to word lines W1, W2,... is added to the semiconductor storage device for writing data of over 4 values in a memory cell 1. Then, by changing the size of a voltage impressed to the word line using this circuit, the data is read out. The reading operation is carried out being divided into plural times so as to read out the specified memory cell everytime the size of the voltage is changed. As the voltage used for the voltage variable circuit is the one equal to the threshold valve of the memory cell, the memory cell may be used, a power voltage is decreased and supplied.
申请公布号 JPH0729383(A) 申请公布日期 1995.01.31
申请号 JP19930193876 申请日期 1993.07.12
申请人 TOSHIBA CORP 发明人 SUGIURA NOBUTAKE;KATO HIDEO;MOCHIZUKI YOSHIO
分类号 G11C11/56;G11C16/02;G11C16/04;G11C16/06;H01L21/8246;H01L27/112 主分类号 G11C11/56
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