摘要 |
By virtue of the present invention, a thermal analysis device is provided, using which thermal analysis can be carried out in different types of atmospheres, by the device having a sample chamber with a sample section and a signal-detection chamber with a signal-detection element, the signal-detection chamber having an inlet opening for a purge gas, the sample chamber and the signal-detection chamber being connected to each other by a purge-gas passage and the sample chamber having an inlet opening for an atmosphere gas and an outlet opening for the atmosphere gas and the purge gas.
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申请人 |
SUMITOMO CHEMICAL CO., LTD., OSAKA, JP;SEIKO INSTRUMENTS INC., TOKIO/TOKYO, JP |
发明人 |
MINOBE, MASAO, TSUCHIURA, IBARAKI, JP;SHIRAGA, NOBORU, TSUKUBA, IBARAKI, JP;NAKAMURA, NOBUTAKA, GOTENBA, SHIZUOKA, JP |