发明名称 Thermal analysis device
摘要 By virtue of the present invention, a thermal analysis device is provided, using which thermal analysis can be carried out in different types of atmospheres, by the device having a sample chamber with a sample section and a signal-detection chamber with a signal-detection element, the signal-detection chamber having an inlet opening for a purge gas, the sample chamber and the signal-detection chamber being connected to each other by a purge-gas passage and the sample chamber having an inlet opening for an atmosphere gas and an outlet opening for the atmosphere gas and the purge gas.
申请公布号 DE4425958(A1) 申请公布日期 1995.01.26
申请号 DE19944425958 申请日期 1994.07.21
申请人 SUMITOMO CHEMICAL CO., LTD., OSAKA, JP;SEIKO INSTRUMENTS INC., TOKIO/TOKYO, JP 发明人 MINOBE, MASAO, TSUCHIURA, IBARAKI, JP;SHIRAGA, NOBORU, TSUKUBA, IBARAKI, JP;NAKAMURA, NOBUTAKA, GOTENBA, SHIZUOKA, JP
分类号 G01N5/00;G01N25/48;(IPC1-7):G01N25/20;G01N31/12 主分类号 G01N5/00
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