发明名称 ELECTRON BEAM SOURCE, ELECTRON BEAM APPLIANCE AND ELECTRON DEVICE USING THIS ELECTRON BEAM SOURCE
摘要 <p>PURPOSE:To generate electron beams with narrow energy width by stacking at least pair of second material and third material in order on the surface of a first material which is a conductor, and allying negative voltage to a facing anode to them. CONSTITUTION:A barrier layer 12 and a quantum well layer 13 whose thicknesses are the penetration length or less of an electron wave are placed on the surface of a conductor needle 11, and negative voltage against a facing electrode is applied to generate electron beams. For example, the needle 11 of an n<+> type GaAs single crystal is used as a test piece and the first material and the film 12 of an AlAs single crystal as the second material is grown at the tip of the needle 11, then the film 13 of a GaAS single crystal as the third material is grown on the film 12. They are put in a vacuum box, and the surface is cleaned by heating, then negative voltage against the facing electrode is applied to increase electrons by tunnel release. An electron beam source which releases electron beams with extremely narrow energy width is provided. Electron microscopes with high resolution and electron spectroscopes with high performance are produced.</p>
申请公布号 JPH0721953(A) 申请公布日期 1995.01.24
申请号 JP19930161621 申请日期 1993.06.30
申请人 HITACHI LTD 发明人 OSHIMA TAKU;KURODA KATSUHIRO;MORI MITSUHIRO;NAKAGAWA KIYOKAZU;MISHIMA TOMOYOSHI;HIRUMA TAKEYUKI;OKAMOTO MASAKUNI;MIYAO MASANOBU
分类号 H01J1/30;H01J1/304;H01J37/073;H01J49/08;(IPC1-7):H01J37/073 主分类号 H01J1/30
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