| 摘要 |
<p>PURPOSE:To make it possible to automate a series of jobs including customer identification of a ROM and testing of the content of the ROM by outputting the output of an identification circuit into which customer information is written at the same time with ion implantation, through an output buffer in the test mode. CONSTITUTION:This is a method wherein ROM data is written by selective ion implantation in a channel region of a MOS transistor, At the same time with ion implantation, customer information is written in identification circuits 131 and 132. The outputs of the identification circuits 131 and 132 are output through output buffers 121, 122,-12n in the test mode and according to the customer information, the corresponding test programs are executed. The output buffers 121, 122,-12n and pads for an external terminal Dout1, Dout2,-Doutn are for common use, so a blanket measuring is available with one probe card. By this method, testing can be done with a test program corresponding to each customer.</p> |
