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发明名称
METHOD FOR MEASURING OUTPUT SIGNAL CHANGE OF SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号
JPH0720205(A)
申请公布日期
1995.01.24
申请号
JP19930151768
申请日期
1993.06.23
申请人
MITSUBISHI ELECTRIC CORP
发明人
NAKAO KENJI
分类号
G01R31/26;G01R31/28;(IPC1-7):G01R31/28
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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