| 摘要 |
<p>The present invention concerns a method and a device for counting and characterising defects on a photographic support. According to the method which is the object of the present invention, the support (1) is caused to pass in front of an optical density measuring device (2), the density values given by the said device being analysed for the purpose of detecting, counting and characterising the defects, the said method being characterised in that the defects are detected for a first speed V1 at which the support (1) passes and in that the data necessary for the counting and characterisation of the defects thus detected are captured and stored for a second speed V2 at which the support passes, less than V1. Application to the processing of photographic films. <IMAGE></p> |
