发明名称 Data output circuit of a semiconductor memory device
摘要 A data output circuit of a semiconductor memory device matches an equalizing level of voltages at data lines in a pair with a logic threshold voltage of data output buffers. The data output circuit having an equalizing transistor connected between first and second nodes connected to the outputs of a sense amplifier, includes a threshold voltage control circuit disposed between the sense amplifier and the data output buffers for allowing a threshold voltage of the data output buffers to match with the equalizing level of the voltages at the first and second nodes. The threshold voltage control circuit has the same structure and characteristics as that of the output buffers, so as to ensure that the logic threshold voltage of the data output buffers matches with the equalizing level of the voltages at the first and second nodes.
申请公布号 US5384736(A) 申请公布日期 1995.01.24
申请号 US19930143895 申请日期 1993.11.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, CHUL-MIN;SUH, YOUNG-HO
分类号 G11C11/417;G11C7/06;G11C7/10;G11C11/409;H03K17/30;H03K17/687;H03K19/0175;(IPC1-7):G11C7/00 主分类号 G11C11/417
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