发明名称 |
Method of fabricating a memory device with a multilayer insulating film |
摘要 |
A method of fabricating a semiconductor device is disclosed. The method comprises the steps of: forming a multi-layer film comprising two or more kinds of layers; performing first etching for patterning said multi-layer film under a first etching condition; and performing second etching for forming irregularities in the side faces of said patterned multi-layer film under a second etching condition.
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申请公布号 |
US5384276(A) |
申请公布日期 |
1995.01.24 |
申请号 |
US19920907862 |
申请日期 |
1992.07.02 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
OGAWA, HISASHI;NABESHIMA, YUTAKA;FUKUMOTO, MASANORI |
分类号 |
H01L21/02;H01L21/311;H01L27/108;(IPC1-7):H01L21/70;H01L27/00 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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