发明名称 Method of fabricating a memory device with a multilayer insulating film
摘要 A method of fabricating a semiconductor device is disclosed. The method comprises the steps of: forming a multi-layer film comprising two or more kinds of layers; performing first etching for patterning said multi-layer film under a first etching condition; and performing second etching for forming irregularities in the side faces of said patterned multi-layer film under a second etching condition.
申请公布号 US5384276(A) 申请公布日期 1995.01.24
申请号 US19920907862 申请日期 1992.07.02
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 OGAWA, HISASHI;NABESHIMA, YUTAKA;FUKUMOTO, MASANORI
分类号 H01L21/02;H01L21/311;H01L27/108;(IPC1-7):H01L21/70;H01L27/00 主分类号 H01L21/02
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