发明名称 Nonvolatile memory device and method for manufacturing same.
摘要 A groove (4) is formed in a semiconductor layer (1, 3), and a source region (2) is formed at a part of the groove within the semiconductor layer. A control gate (6) is buried via a first insulating layer (5) within the groove. A floating gate (8) is formed via a second insulating layer (5) on the control gate. The floating gate extends over the first insulating layer. A drain region (9, 9') is formed within the semiconductor layer apart from the groove. <IMAGE>
申请公布号 EP0601747(A3) 申请公布日期 1995.01.18
申请号 EP19930309435 申请日期 1993.11.25
申请人 NIPPON ELECTRIC CO 发明人 OKAZAWA TAKESHI C O NEC CORPOR
分类号 G11C17/00;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792 主分类号 G11C17/00
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