METHOD AND APPARATUS FOR TEST OF SEMICONDUCTOR,申请号JP19960250064-传众专利搜索

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发明名称	METHOD AND APPARATUS FOR TEST OF SEMICONDUCTOR
摘要
申请公布号	JPH1090352(A)	申请公布日期	1998.04.10
申请号	JP19960250064	申请日期	1996.09.20
申请人	NEC CORP	发明人	YAMAKITA NAOYA
分类号	G01R31/26;G01R31/28;G06F11/22;(IPC1-7):G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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