| 摘要 |
Before a measurement for an infrared analysis of a sample is performed, a measurement area of the sample is set. In the measurement area setting mode, a camera takes the image of the whole sample, and the image is shown on a display. An image of an aperture is superimposed on the image of the sample in the display. When an operator uses a mouse connected to a controller of the infrared microscope to change the width of the image of the aperture on the display, an aperture signal generator generates an aperture signal corresponding to the width of the aperture image. An aperture image signal generator receives the aperture signal and generates an aperture image signal having the width. Thus the image of the sample superimposed on the image of the aperture in the display changes accordingly, by which the operator confirms the measurement area, i.e., the position and width of the aperture, in the sample. Since the image of the aperture is generated electronically in the present invention, no hardware such as expensive lenses or a precise mirror-moving mechanism is necessary./!
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