发明名称 |
Polishing apparatus for notch portion of wafer. |
摘要 |
<p>Apparatus (1) for polishing a notch (32) on the periphery of a wafer (W) comprises: a table (2) for supporting the wafer; buff (7), adapted to polish the notch, which is rotatable about a first axis substantially parallel to the surface of the wafer; means (8) for rotating the buff; means (9) for supporting the buff; means (10) for adjusting the pressure applied by the buff to the notch; and means (4,4a,5,6) for rotating the table about a second axis which is substantially parallel to the first axis, so that the applied pressure acts on the bottom wall of the wafer, in the notch, in a direction substantially perpendicular to the surface of said bottom wall. <IMAGE></p> |
申请公布号 |
EP0633097(A1) |
申请公布日期 |
1995.01.11 |
申请号 |
EP19940304858 |
申请日期 |
1994.07.01 |
申请人 |
SHIN-ETSU HANDOTAI COMPANY LIMITED;FUJIKOSHI MACHINERY CORPORATION |
发明人 |
HASEGAWA, FUMIHIKO, C/O SHIN ETSU HANDOTAI CO.,;OHTANI, TATSUO, C/O SHIN-ETSU HANDOTAI CO., LTD.;ICHIKAWA, KOICHIRO, C/O FIJIKOSHI MACHINERY CORP.;NAKAMURA, YOSHIO, C/O FIJIKOSHI MACHINERY CORP. |
分类号 |
B24B9/06;B24B9/00;B24B29/00;B24B29/02;H01L21/304;(IPC1-7):B24B9/06 |
主分类号 |
B24B9/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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