发明名称 Polishing apparatus for notch portion of wafer.
摘要 <p>Apparatus (1) for polishing a notch (32) on the periphery of a wafer (W) comprises: a table (2) for supporting the wafer; buff (7), adapted to polish the notch, which is rotatable about a first axis substantially parallel to the surface of the wafer; means (8) for rotating the buff; means (9) for supporting the buff; means (10) for adjusting the pressure applied by the buff to the notch; and means (4,4a,5,6) for rotating the table about a second axis which is substantially parallel to the first axis, so that the applied pressure acts on the bottom wall of the wafer, in the notch, in a direction substantially perpendicular to the surface of said bottom wall. &lt;IMAGE&gt;</p>
申请公布号 EP0633097(A1) 申请公布日期 1995.01.11
申请号 EP19940304858 申请日期 1994.07.01
申请人 SHIN-ETSU HANDOTAI COMPANY LIMITED;FUJIKOSHI MACHINERY CORPORATION 发明人 HASEGAWA, FUMIHIKO, C/O SHIN ETSU HANDOTAI CO.,;OHTANI, TATSUO, C/O SHIN-ETSU HANDOTAI CO., LTD.;ICHIKAWA, KOICHIRO, C/O FIJIKOSHI MACHINERY CORP.;NAKAMURA, YOSHIO, C/O FIJIKOSHI MACHINERY CORP.
分类号 B24B9/06;B24B9/00;B24B29/00;B24B29/02;H01L21/304;(IPC1-7):B24B9/06 主分类号 B24B9/06
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