SEMICONDUCTOR MEMORY TESTING DEVICE

摘要

PURPOSE: A semiconductor memory testing device is provided to examine whether or not memory has malfunction by testing it with variable voltage. CONSTITUTION: A semiconductor memory testing device consists of a power control part(31) and an over current clamp part(32). The power control part(31) transmits control signal to power supply(10) by the power control signal from CPU. Then, power supply(10) sends power to semiconductor memory(20) on main board(1). To control the output voltage, the power control part has an analog/digital converter. The over current clamp part(32) is connected with output port of the power control part(31) and it prevents over current. Therefore, semiconductor memory is preserved even in case of a power shortage.