发明名称 Structure to recover a portion of a partially functional embedded memory.
摘要 According to the present invention, one or more addresses are forced to a logic state to define a smaller, fully functional portion of embedded memory. A first preferred embodiment has a first fuse circuit and a second fuse circuit which control the conduction and the output signal of a transmission gate which passes through an address signal. The output signal of both the first and the second fuse circuits are input signals to logic circuitry which produces a first input signal and a second input signal to the transmission gate. When the first fuse is blown, the address signal is forced to a first logic state and when the second fuse is blown, the address signal is forced to a second logic state. When neither the first fuse nor the second fuse is blown, the address signal is simply passed through the transmission gate. A second preferred embodiment of the present invention has a first fuse circuit, a second fuse circuit, and an inverting stage through which an address signal passes. When the first fuse is blown, the address signal is forced to a first logic state and when the second fuse is blown, the address signal is forced to a second logic state. When neither the first fuse nor the second fuse is blown, the address signal is inverted. <IMAGE>
申请公布号 EP0621537(A3) 申请公布日期 1995.01.11
申请号 EP19940302808 申请日期 1994.04.20
申请人 SGS THOMSON MICROELECTRONICS 发明人 MCCLURE DAVID CHARLES
分类号 G11C11/413;G11C8/06;G11C29/00;G11C29/04;G11C29/44;(IPC1-7):G06F11/20 主分类号 G11C11/413
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