发明名称 |
Logic-circuit layout pattern inspection method and logical simulation |
摘要 |
A circuit layout pattern inspection method and a logical simulator for implementing the same. Wiring is substituted by a pi or T equivalent circuit and is described by a nodal equation, and a gate is described by a simplified model, that is, a current source calculation formula. By the nodal equation and the current source calculation formula, a simulation is performed to obtain a delay time for every node. The obtained delay time is stored to make the inspection easy.
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申请公布号 |
US5381345(A) |
申请公布日期 |
1995.01.10 |
申请号 |
US19920935994 |
申请日期 |
1992.08.27 |
申请人 |
ROHM CO., LTD. |
发明人 |
TAKEGAMI, HIROSHI;MORIKAWA, MAKOTO;FUJIKI, HIROKAZU |
分类号 |
G01R31/28;G06F17/50;H01L21/66;(IPC1-7):G06F15/60 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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