发明名称 Logic-circuit layout pattern inspection method and logical simulation
摘要 A circuit layout pattern inspection method and a logical simulator for implementing the same. Wiring is substituted by a pi or T equivalent circuit and is described by a nodal equation, and a gate is described by a simplified model, that is, a current source calculation formula. By the nodal equation and the current source calculation formula, a simulation is performed to obtain a delay time for every node. The obtained delay time is stored to make the inspection easy.
申请公布号 US5381345(A) 申请公布日期 1995.01.10
申请号 US19920935994 申请日期 1992.08.27
申请人 ROHM CO., LTD. 发明人 TAKEGAMI, HIROSHI;MORIKAWA, MAKOTO;FUJIKI, HIROKAZU
分类号 G01R31/28;G06F17/50;H01L21/66;(IPC1-7):G06F15/60 主分类号 G01R31/28
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