发明名称 LEAD BENT INSPECTING METHOD FOR IC DEVICE
摘要 PURPOSE:To inspect a lead bent while feeding a lead at a constant speed by simple conveying means. CONSTITUTION:A lead bent detector 50 having first lead bent detecting means 51 for detecting a radial bent of a lead L of a device D and second lead bent detecting means 52 for detecting a bent of the lead in a pitching direction is disposed. The device D is moved from an upstream side chute 10a to a device mount bed 25, stopped at a position in contact with a stopper 26, a motor 24 is operated to feed a belt 21, and the bed 25 is once displaced to a position to be connected to a downstream side chute 10b. Then, the motor 24 is reversely rotated to feed the belt 21 at a constant speed thereby to displace the bed 25 in an opposite direction to its own weight, and presence or absence of the bent of the lead is inspected by the detecting means 50 during this period.
申请公布号 JPH077300(A) 申请公布日期 1995.01.10
申请号 JP19930167296 申请日期 1993.06.15
申请人 HITACHI ELECTRON ENG CO LTD 发明人 MURANO HISASHI;YOKOZAWA KAZUHIDE;FUJII TAKESHI;SUZUKI TAKAHITO;NISHIZAKI HISAO
分类号 H05K13/08 主分类号 H05K13/08
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