发明名称 METHOD FOR ANALYZING PHYSICAL PROPERTY OF ELECTRO-OPTICAL ACTIVE THIN LAYER
摘要 <p>PURPOSE: To easily analyze distribution of function characteristic and surface structure with high contrast by exposing a layer or layer structure to be analyzed to a polarized light to excite a waveguide mode, and regenerating the horizontal difference of electrochemical characteristic of a sample by a load modulated electric field. CONSTITUTION: A gold electrode 2 is evaporated on the base bottom surface of a 90 deg. glass prism 1 functioning as a waveguide coupler, a nonlinear electrooptical active thin layer (for example, polymer film) 3 is formed thereon by spin coating followed by drying, and top electrodes 4A, 4B are evaporated thereon. A dc modulated electric field 9 of 100 V/μm at 110 deg.C higher than glass transition point Tg is loaded on a polarizing band 5 to polarize the light. A bang B is set as non-polarized contrast area, both bands A, B are photographed by a TV camera 6, the reflected light from a laser 7 is recorded as the function of incident angle, and the photographed 6 image is recorded on a magnetic tape. The modulated electric field 9 is loaded between the electrodes 2, 4 in this way, whereby the distribution of electroopitical effect of the band A can be observed.</p>
申请公布号 JPH075099(A) 申请公布日期 1995.01.10
申请号 JP19930080581 申请日期 1993.04.07
申请人 BASF AG 发明人 HAARARUTO FUKUSU;BUORUFUGANGU KUNORU;EEMIIRU AUSUTO
分类号 G01N21/21;G01N21/552;G01N21/84;G02F1/19;(IPC1-7):G01N21/21 主分类号 G01N21/21
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