发明名称 X-RAY INSPECTION DEVICE
摘要 PURPOSE: To provide an X-ray inspection system equipped with an imaging part having plural image sensors while providing an image processing part for forming an image by assembling plural sub-images with a resynthetic image in which non-consistency does not practically exist. CONSTITUTION: This system is provided with an imaging part 11 having multisensors 10 to be used for the X-ray inspection system, for which an effective sensor area is increased in comparison with a single sensor image, for coupling plural partially overlapped sub-images and this imaging part 11 is suitable for imaging the area output screen of high image intensifier through semiconductor image sensors 10a-10d. The non-consistency of image caused by difference in the arranging direction of the respective image sensors 10a-10d is corrected by performing geometrical transformation to respective electronic sub-images generated by the image sensors. The transformed electronic sub- images are assembled with the resynthetic image. Picture quality is further improved by performing uniforming processing to the overlapped area of transformed sub-images.
申请公布号 JPH076228(A) 申请公布日期 1995.01.10
申请号 JP19940082506 申请日期 1994.03.28
申请人 PHILIPS ELECTRON NV 发明人 KORUNERISU HERUMAN SURANPU;MARUTON ONNO HARUMUSU;GEERUTO YAN RAANSUTORA;RUDORUFU MARIA SUNOEREN
分类号 A61B6/00;G06T1/00;G06T3/00;H04N5/262;H04N5/32 主分类号 A61B6/00
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