发明名称 PROCESSING OF INTEGRATED CIRCUIT IN WAFER FORM AFTER CUTTING INTO CHIP
摘要 <p>PURPOSE: To provide a process for manufacturing a device that is free from fabrication debris, particularly a micromechanical device such as DMDs, wherein a wafer is allowed to be sawn before the completion of all processing steps. CONSTITUTION: A device, which is easy too fragile to allow cleaning after a device manufacturing process has ended. To overcome this problem, a wafer is sawed and cleaned prior to a series of manufacturing steps that makes the device fragile. To avoid processing chips 30 individually, a substrate wafer 28 is attached to the backside of a dicing tape 24. Since the wafer 28 holds the sawn chips 30 well aligned, the chips 30 can be subjected to the remaining manufacturing steps in the form of a wafer.</p>
申请公布号 JPH076983(A) 申请公布日期 1995.01.10
申请号 JP19940033642 申请日期 1994.03.03
申请人 TEXAS INSTR INC <TI> 发明人 GUREGORII SHII SUMISU
分类号 G02B26/08;H01L21/301;(IPC1-7):H01L21/301 主分类号 G02B26/08
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