发明名称 MANUFACTURING METHOD OF FET
摘要 forming AlxGa1-xAs layer (24a) lattice-matched with a GaAs substrate (20); forming an n channel layer (22) in the substrate (20); forming an Al cap metal (25); etching the layer (24a) with the cap metal mask to form a photoresist pattern as an impurity implantation region pattern; forming an AlGaAs dummy gate (24) by using a mesa-etching; removing the pattern and the cap metal to form and aneal an oxide film thereon to activate the layers (24a,24); forming an opening part into the oxide film to form 1st and 2nd electrode (28) ohmic-contacted with the gate (24); removing the dummy gate (24) to form a mesa hole; and forming a gate electrode (32) into the hole thereby forming a dummy gate with fine line width to reduce the effective gate length.
申请公布号 KR950000157(B1) 申请公布日期 1995.01.10
申请号 KR19920004832 申请日期 1992.03.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JONG - RYOL
分类号 H01L21/338;H01L29/812;(IPC1-7):H01L29/812 主分类号 H01L21/338
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