发明名称 |
MANUFACTURING METHOD OF FET |
摘要 |
forming AlxGa1-xAs layer (24a) lattice-matched with a GaAs substrate (20); forming an n channel layer (22) in the substrate (20); forming an Al cap metal (25); etching the layer (24a) with the cap metal mask to form a photoresist pattern as an impurity implantation region pattern; forming an AlGaAs dummy gate (24) by using a mesa-etching; removing the pattern and the cap metal to form and aneal an oxide film thereon to activate the layers (24a,24); forming an opening part into the oxide film to form 1st and 2nd electrode (28) ohmic-contacted with the gate (24); removing the dummy gate (24) to form a mesa hole; and forming a gate electrode (32) into the hole thereby forming a dummy gate with fine line width to reduce the effective gate length.
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申请公布号 |
KR950000157(B1) |
申请公布日期 |
1995.01.10 |
申请号 |
KR19920004832 |
申请日期 |
1992.03.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JONG - RYOL |
分类号 |
H01L21/338;H01L29/812;(IPC1-7):H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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